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Atomic Force Microscopes from AFMWorkshop, Bridgin the Gap Between Price & Performance.
Atomic Force Microscopes from AFMWorkshop, Bridgin the Gap Between Price & Performance.

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AFMWorkshop and Dalia Yablon, Ph.D. of Surface Char LLC, are pleased to announce a new AFM Curriculum for undergraduates: Laboratory -Based Curriculum for Atomic Force Microscopy: Atomic force microscopy to make nanoscale material and topographic measurements of materials. http://www.afmworkshop.com/afm-curriculum.html
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Why is Atomic Force Microscopy the technique of choice for polymer characterization? Here's a link to recently published polymer research using AFMs from AFMWorkshop and announcing a May, 2016 short-course in Boston focused on the use of AFM to characterize polymers. The course is led by Dalia Yablon, Ph.D.

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2015 saw a nearly exponential growth in the published citations of AFMWorkshop's Atomic Force Microscopes. And, early 2016's citations have already revealed the diversity in successful research applications for the TT-AFM. http://www.afmworkshop.com/research-and-publishing-with-afmworkshop.html
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Atomic Force Microscopes (AFMs) are well-suited for photonics applications. AFM provides extreme contrast on flat samples, yields three dimensional images, and can examine optically transparent materials. Gratings, thin films, and analysis of polished fused silica substrates are discussed in a recent AFMWorkshop entry:  http://www.afmworkshop.com/using-afm-for-photonics-applications.html
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You're Invited: Livestreaming Demo of the TT-AFM with Q&A. November 18, 2015, 0800 PST, register online here:  http://events.constantcontact.com/register/event?llr=7ab5jwdab&oeidk=a07ebsrg922c2a9e5f9 We look forward to answering your questions and reviewing the variety of applications for the TT-AFM.

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Have you experienced difficulties when trying to align your AFM laser onto its cantilever? Or when looking for sample surface features to scan with the AFM? How about when attempting your probe approach? AFMWorkshop's latest post describes methods for combining optical and atomic force microscopy, and the key specifications for your optical microscope.  http://www.afmworkshop.com/afm-success-requires-optical-microscopy.html

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It's time to stop and celebrate the success of AFMWorkshop customers in their research, along with our 5th Anniversary! The early and exponential growth in customer research publications bolsters our raison d'etre: removing price barriers that have traditionally hindered growth in the application of high-quality atomic force microscopy worldwide. http://www.afmworkshop.com/success-in-research-with-afmworkshop.html
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Have you planned on the potential impacts of surface contamination when scanning samples with your Atomic Force Microscope (AFM)?One of the great advantages in working with AFMs is their ability to image samples in ambient air, bypassing any need for a vacuum chamber. It's essential however for AFM users to recognize and plan around the fact that in ambient air, surfaces have a contamination layer comprised of hydrocarbons and water vapor. AFMWorkshop's recent e-newsletter discusses diagnosing contamination. What are your experiences with surface contamination and AFM scanning?

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How does an Atomic Force Microscope (AFM) “see”? Here's a recent article explaining an AFM's 5 image channels, and how images are acquired from the Z feedback loop. Do you have information to add, or questions to ask?

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Are you confident in your Atomic Force Microscope's calibration? We've compiled some novel and fairly easy step-by-step methods for cleaning both heavy and microscopic contamination from AFM reference/calibration samples. Often improperly stored and/or generally mishandled in lab environments, once these references are contaminated they're difficult to use for calibration. You can read the procedures here: http://www.afmworkshop.com/methods-for-cleaning-afm-reference-calibration-samples.html.  Do you have alternate methods or experiences that you would like to share?
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