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nanotools
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Publication update:
Discover how M-CNT-150 AFM tips help to determine the impact of DSA process flow, pattern density and BCP film thickness on template fill:
http://www.nanotools.com/blog/afm-monitoring-of-template-fill-in-graphoepitaxy-dsa.html
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Publication update:
See how the mechanical properties of evaporated and UV cross-linked polymer structures are reliably characterized by means of spherical full carbon AFM tips with 150 nm radius:
http://www.nanotools.com/blog/mechanical-properties-of-nanometer-thin-polymer-films.html
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Publication in focus:
Tae-Gon Kim et al: "Atomic Resolution Quality Control for Fin Oxide Recess by Atomic Resolution Profiler"
For more information, visit:
http://www.nanotools.com/blog/in-focus-finfet-metrology.html
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Publication update:
nanotools supersharp EBD-SSS tips featured in research article
"High-resolution imaging of the nanostructured surface of polyacrylonitrile-based fibers" Journal of Materials Science, Volume 51, Issue 21, pp 9638–9648, November 2016.
For more information, visit:
http://www.nanotools.com/blog/high-res-imaging-of-pan-based-fibers.html
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Publication update:
Discover how nanotools M-CNT-100 tips enable to gain insight into oxide recess uniformity in FinFET devices: http://www.nanotools.com/blog/atomic-resolution-quality-control-for-fin-oxide-recess.html
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Blue Line product update:
QUANTUM-PRO: The New Standard for Fast Scanning Applications.
For more information, visit:
www.nanotools.com/blog/quantum-series.html
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Publication update:
nanotools spherical AFM tips featured in research article "Stress measurements of planar dielectric elastomer actuators" Review of Scientific Instruments, Volume 87, 053901, May 2016. For more information, visit:
http://www.nanotools.com/blog/stress-measurements-of-planar-dea.html
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Publication update:
nanotools CDR-EBD tips featured in research article: "Measurements of CD and sidewall profile of EUV photomask structures using CD-AFM and tilting-AFM" Measurement Science and Technology, Volume 25, March 2014. For more information, visit:
http://www.nanotools.com/blog/cd-characterization-of-euv-photomask-structures.html
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Publication update:
nanotools M-CNT tips featured in research article: "Demonstration of ultra-high-resolution MFM images using Co90Fe10-coated CNT probes" Journal of Magnetism and Magnetic Materials, Volume 322, February 2010, Pages 332–336. For more information, visit:
http://www.nanotools.com/blog/ultra-high-resolution-magnetic-force-microscopy.html
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