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John Blyler
Editorial Director, Extensionmedia - Affiliate Professor, PSU
Editorial Director, Extensionmedia - Affiliate Professor, PSU
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Three very different conferences from Jama, ARM and TSMC highlight the breadth and depth of IP development in the semiconductor and IoT spaces.

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Mosier, United States
by David Talley

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I just finished a fascinating interview with Dr. Clifford Johnson, the well-known physicist who advised on the new National Geographic series, GENIUS. Look for the write-up later next week. Ann now I have to catch-up on the series!

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Patent Myths and University Entanglements
April 14, 2017

During a panel hosted by the IEEE-RFIC IMS event, Mediatek’s Shanaa talked about patent myths and issues with university and the USPTO systems.

By John Blyler, Editorial Director, Semi-IP Systems

This is the continuing coverage of a joint IEEE-RFIC IMS Panel on the “Good, the Bad and the Ugly of Patents,” moderated by Oren Eliezer from Applied Research Center. In this part, Osama Shanaa, Senior Director of RF Design at Mediatek, shared his viewpoints from both industry and academia on innovation and the US Patent system. What follows is a slightly paraphrased version of his talk. – JB

Notable Quotes:

- USPTO activity is neither a test of whether an idea is working nor whether a patent is worthy or unworthy.
- You could end up educating your competition by filing a patent.
- Once the USPTO issues a patent, it protects the invention. Not so.
- Patents tend to address problems for which there are many ways solutions.
- Patents are stronger if they are grouped in larger numbers
- Should universities patent?
- What should we do with the US patent system?

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Chip and System Reliability Experts Assemble
The annual International Reliability Physics Symposium (IRPS) expands system reliability coverage to complement traditional microelectronics focus.

By John Blyler, Editor-in-Chief, Journal of Reliability, Maintainability and Supportability in Systems Engineering

Systems reliability continues to grow as an important subject at the 2017 IEEE International Reliability Physics Symposium (IRPS), which starts on April 2nd in Monterey, CA. The 54 year old symposium covers the range of reliability physics concerns for current technologies and “continues to explore the connection between transistor physics of failure and system reliability.” For the latter, this year’s topics will include discussions on functional clones, telemetry, COTS, physics- and data-driven models, and organizational impacts on reliability. Here’s a brief summary of each:

Today’s Functional Electronic Clones ...

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Meeting the 20 billion IOT devices prediction by 2020 will require the semiconductor industry to streamline its processes for up and coming chip designers.

By John Blyler, Editorial Director, IOT Embedded Systems

Part I of this article covered the difficulties in designing System-on-Chip (SOC) devices for the Internet-of-Things (IOT) market, as explained by Jim Bruister, CEO of SOC Solutions, during his talk at the inaugural REUSE event. In Part II, we will examine ways for the semiconductor and electronics industries to improve the development process for the next generation of IOT designers. — JB

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NASA TV: Coverage of Dragon's departure from Intern. Space Station. Very cool!

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Why is Chip Design for IOT so Hard?

Internet-of-Things (IOT) designers face a different set of challenges from their traditional ASIC and SOC brethren. Will the market be ready?

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Look out! The president is not going to be happy when Steve Bannon tells him about this. This is not fake news! #China #trade #industries
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